Optical characterization of multilayer systems with randomly rough boundaries
| Autoři | |
|---|---|
| Rok publikování | 1999 |
| Druh | Článek ve sborníku |
| Konference | 18th Congress of the International Commision for Optics: Optics for the Next Millennium |
| Fakulta / Pracoviště MU | |
| Citace | |
| Obor | Fyzika pevných látek a magnetismus |
| Klíčová slova | multilayer systems; rough boundaries; coherent reflectance; optical characterization |
| Popis | In this contribution examples of the optical characterization of multilayer systems with randomly rough boundaries are presented. The method based on measuring and interpreting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of sample of three-layer and thirteen-layer systems exhibiting the rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2. |
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