Project information
Vývoj metod pro charakterizaci defektů na površích pevných látek

Information

This project doesn't include Faculty of Arts. It includes Faculty of Science. Official project website can be found on muni.cz.

Project Identification

FT-TA/094

Project Period

5/2004 - 12/2007

Investor / Pogramme / Project type

Ministry of Industry and Trade of the CR

TANDEM

MU Faculty or unit

Faculty of Science

prof. RNDr. Ivan Ohlídal, DrSc.

Publications

Total number of publications: 7

2006

Characterization of polymer thin films deposited on aluminum films by the combined optical method and atomic force microscopy

FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr NEPUSTILOVÁ Růžena BAJER Svatopluk

Article in Periodical

Surface and Interface Analysis, year: 2006, volume: 38, edition: 4
Influence of lateral dimensions of the irregularities on the optical quantities of rough surfaces

FRANTA Daniel OHLÍDAL Ivan

Article in Periodical

Journal of Optics A: Pure and Applied Optics, year: 2006, volume: 8, edition: 9

2005

Application of the wavelet transformation in AFM data analysis

KLAPETEK Petr OHLÍDAL Ivan

Article in Periodical

Acta Physica Slovaca, year: 2005, volume: 55, edition: 3
Combination of optical methods and atomic force microscopy at characterization of thin film systems

OHLÍDAL Ivan FRANTA Daniel KLAPETEK Petr

Article in Periodical

Acta physica slovaca, year: 2005, volume: 55, edition: 3
Comparison of effective medium approximation and Rayleigh-Rice theory concerning ellipsometric characterization of rough surfaces

FRANTA Daniel OHLÍDAL Ivan

Article in Periodical

Optics Communications, year: 2005, volume: 248, edition: 1
Měření nanodrsnosti pomocí optických metod a mikroskopie atomové síly

OHLÍDAL Ivan FRANTA Daniel KLAPETEK Petr

Article in Proceedings

Kvalita a GPS 2005, year: 2005
Scanning thermal microscopy - theory and applications

KLAPETEK Petr OHLÍDAL Ivan BURŠÍK Jiří

Article in Periodical

Jemná mechanika a optika, year: 2005, volume: 50, edition: 11-12