Vacuum variable-angle far-infrared ellipsometer
| Authors | |
|---|---|
| Year of publication | 2017 |
| Type | Article in Periodical |
| Magazine / Source | Applied Surface Science |
| MU Faculty or unit | |
| Citation | |
| Doi | http://dx.doi.org/10.1016/j.apsusc.2016.10.125 |
| Keywords | Far infrared ellipsometry; Phonons; SrTiO3; |
| Description | We present the design and performance of a vacuum far-infrared (similar to 50-680 cm(-1)) ellipsometer witha rotating analyser. The system is based on a Fourier transform spectrometer, an in-house built ellipsometer chamber and a closed-cycle bolometer. The ellipsometer chamber is equipped with a computer controlled theta-2 theta goniometer for automated measurements at various angles of incidence. We compare our measurements on SrTiO3 crystal with the results acquired above 300 cm(-1) with a commercially available ellipsometer system. After the calibration of the angle of incidence and after taking into account the finite reflectivity of mirrors in the detector part we obtain a very good agreement between the data from the two instruments. The system can be supplemented with a closed-cycle He cryostat for measurements between 5 and 400 K. (C) 2016 Published by Elsevier B.V. |
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