Structural investigation of semiconductor nanostructures by x-ray techniques

Investor logo

Warning

This publication doesn't include Faculty of Arts. It includes Faculty of Science. Official publication website can be found on muni.cz.
Authors

STANGL Julian HESSE Anke ROCH Tomáš HOLÝ Václav

Year of publication 2002
Type Article in Periodical
Magazine / Source Nuclear Instruments & Methods in Physics Research A
MU Faculty or unit

Faculty of Science

Citation
Field Solid matter physics and magnetism
Keywords Structural investigation of semiconductor nanostructures by x-ray techniques
Description Structural investigation of semiconductor nanostructures by x-ray techniques
Related projects:

You are running an old browser version. We recommend updating your browser to its latest version.