High-Resolution X-Ray Scattering From Thin Films to Lateral Nanostructures

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Authors	HOLÝ Václav PIETSCH Ullrich BAUMBACH Tilo
Year of publication	2004
Type	Monograph
MU Faculty or unit	Faculty of Science
Citation
Description	High-Resolution X-Ray Scattering From Thin Films to Lateral Nanostructures
Related projects:	Self-organization processes on the interfaces during epitaxial growth of semiconductor superlattices Physical properties of new materials and layered structures