Atomic Force Microscope Tip Influence on the Fractal and Multi-Fractal Analyses of the Properties of Randomly Rough Surafaces
| Authors | |
|---|---|
| Year of publication | 2005 |
| Type | Article in Proceedings |
| Conference | Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro-and Nanometer Range |
| MU Faculty or unit | |
| Citation | |
| Field | Solid matter physics and magnetism |
| Keywords | AFM |
| Description | In this chapter several fractal and multi-fractal analysis methods are studied to characterize their efficiency on evaluating fractal properties of randomly rough surfaces. Moreover, results concerning estimation of atomic force microscopy (AFM) tip influence on evaluation of fractal properties of rough surfaces are presented. Randomly rough surfaces are simulated by means of spectral synthesis method and AFM tip convolution with the simulated surface is numerically performed. The results of the fractal and multi-fractal analysis before and after tip convolution are compared. It is shown that significant discrepancies can be observed between different fractal analysis methods applied on the same simulated data. This fact is true in particular if the data are convolved with AFM tip having relatively large apex radius in comparison to objects forming surface roughness |
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