Interval Estimators of the Centre and Width of a Two-Dimensional Microstructure
Authors | |
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Year of publication | 2009 |
Type | Article in Periodical |
Magazine / Source | Measurement Science Review |
MU Faculty or unit | |
Citation | |
Field | Applied statistics, operation research |
Keywords | confidence interval; evaluating of measured data; fitting by a regression line |
Description | In metrology it is used to estimate the stipulated quantity as a mean and its uncertainty. This procedure is legitimate when the evaluated data are symmetrically distributed and the distribution is (at least approximately) known. But there are many evaluating treatments in which the evaluated values are non-symmetrically distributed. Here we must use the interval estimator for the stipulated quantities. In the paper are presented interval estimators for some parameters of two-dimensional structures. |
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