Characterization of ultrananocrystalline diamond thin films using low energy scanning electron microscopy
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Year of publication | 2011 |
Type | Conference abstract |
MU Faculty or unit | |
Citation | |
Description | This paper deals with the low energy scanning electron microscopy characterization of ultrananocrystalline diamond films. These films were prepared by plasma enhanced chemical vapor deposition (PECVD) using dual frequency discharge. |
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