Ellipsometry of Thin Film Systems

Warning

This publication doesn't include Faculty of Arts. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	OHLÍDAL Ivan FRANTA Daniel
Year of publication	2000
Type	Chapter of a book
MU Faculty or unit	Faculty of Science
Citation
Description	In this paper, a review of both the important theoretical and experimental results concerning ellipsometry is presented.
Related projects:	Common laboratories for applied plasma physics and plasma chemistry in PřF and PedF MU, VA Brno and ÚFP AV ČR in Prague Characterization of multilayer systems with randomly rough boundaries by means of optical and X - ray methods